Structural and optical characterisation of planar waveguides obtained via Sol-Gel
نویسندگان
چکیده
Planar waveguides of SiO2:TiO2 (multilayer structure) and SiO2:CeO2 (thick layer) were prepared onto commercial glass substrates using a sol-gel technique combined with dip-coating. These glassy coatings were structural characterised by Transmission Electron Microscopy (TEM) Energy Dispersive X-ray analysis and by Confocal Microscopy. Thicknesses of 1230 nm and 4,15 μm and refractive indices of 1.59 and 1.48 for SiO2:TiO2 (70:30) and SiO2:CeO2 (95:5) waveguides were obtained, respectively, by Spectroscopic Ellypsometry. Losses of 0.8 dB/cm were measured by double prism method in the SiO2:CeO2 system.
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